SV PROBE PTE LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 29130
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 6127
 
  
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 390
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 155
 
  
 
B24D TOOLS FOR GRINDING, BUFFING, OR SHARPENING 129
 
  
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING143
 
  
 
B32B LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM1156
 
  
 
C25D PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING 150
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8430676 Modular space transformer for fine pitch vertical probing applicationsAug 10, 09Apr 30, 13[H01R]
8299394 Approach for assembling and repairing probe assemblies using laser weldingJun 15, 07Oct 30, 12[B23K]
8222912 Probe head structure for probe test cardsMar 12, 09Jul 17, 12[G01R]
8058887 Probe card assembly with interposer probesJan 23, 08Nov 15, 11[G01R]
8058889 Probe card with segmented substrateNov 30, 05Nov 15, 11[G01R]
8026734 Dual tip test probe assemblyJun 24, 09Sep 27, 11[G01R]
7808260 Probes for a wafer test apparatusFeb 16, 06Oct 05, 10[G01R]
7733104 Low force interconnects for probe cardsApr 21, 08Jun 08, 10[G01R]
7679383 Cantilever probe cardFeb 28, 07Mar 16, 10[G01R]
7638028 Probe tip platingAug 03, 05Dec 29, 09[C25D]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0176,831 Probe Test Card with Flexible Interconnect StructureAbandonedJan 14, 09Jul 15, 10[G01R]
2009/0174,423 Bond Reinforcement Layer for Probe Test CardsAbandonedMar 05, 09Jul 09, 09[G01R]
2007/0200,576 Multi-layered probesAbandonedFeb 07, 07Aug 30, 07[G01R]
2007/0089,551 Cantilever probe structure for a probe card assemblyAbandonedSep 29, 06Apr 26, 07[G01B, G01D]
2006/0028,220 Reinforced probes for testing semiconductor devicesAbandonedJul 19, 05Feb 09, 06[G01R]
6937044 Bare die carrierExpiredMar 24, 00Aug 30, 05[G01R]
6525552 Modular probe apparatusExpiredMay 11, 01Feb 25, 03[G01R]
6507207 Contact probe pin for wafer probing apparatusExpiredFeb 20, 01Jan 14, 03[G01R]
6426637 Alignment guide and signal transmission apparatus and method for spring contact probe needlesExpiredDec 21, 99Jul 30, 02[G01R]
6424164 Probe apparatus having removable beam probesExpiredJun 13, 00Jul 23, 02[G01R]
6419500 Probe assembly having floatable buckling beam probes and apparatus for abrading the sameExpiredMar 08, 99Jul 16, 02[H01R, G01P, H05K]
6420887 Modulated space transformer for high density buckling beam probe and method for making the sameExpiredJun 13, 00Jul 16, 02[G01R]
6245445 Rough electrical contact surfaceExpiredMar 02, 99Jun 12, 01[C25D, G01R]
5973504 Programmable high-density electronic device testingExpiredSep 08, 97Oct 26, 99[G01R]
5952843 Variable contact pressure probeExpiredMar 24, 98Sep 14, 99[G01R]
5876580 Rough electrical contact surfaceExpiredJan 12, 96Mar 02, 99[C25D]
5847571 Membrane probing of circuitsExpiredJul 03, 96Dec 08, 98[G01R]
5841291 Exchangeable membrane probe testing of circuitsExpiredDec 12, 96Nov 24, 98[G01R]
5828226 Probe card assembly for high density integrated circuitsExpiredNov 06, 96Oct 27, 98[G01R]
5764072 Dual contact probe assembly for testing integrated circuitsExpiredDec 20, 96Jun 09, 98[G01R]

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